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@@ -87,6 +87,12 @@ channel_connect_for_circuit(const tor_addr_t *addr, uint16_t port,
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static circid_t
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get_unique_circ_id_by_chan(channel_t *chan)
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{
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+/* This number is chosen somewhat arbitrarily; see comment below for more
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+ * info. When the space is 80% full, it gives a one-in-a-million failure
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+ * chance; when the space is 90% full, it gives a one-in-850 chance; and when
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+ * the space is 95% full, it gives a one-in-26 failure chance. That seems
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+ * okay, though you could make a case IMO for anything between N=32 and
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+ * N=256. */
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#define MAX_CIRCID_ATTEMPTS 64
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int in_use;
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unsigned n_with_circ = 0, n_pending_destroy = 0;
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@@ -123,9 +129,8 @@ get_unique_circ_id_by_chan(channel_t *chan)
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* whole circuit ID space every time we extend a circuit, which is
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* not so great either.
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*/
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- if (! chan->warned_circ_ids_exhausted) {
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- chan->warned_circ_ids_exhausted = 1;
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- log_warn(LD_CIRC,"No unused circIDs found on channel %s wide "
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+ log_fn_ratelim(&chan->last_warned_circ_ids_exhausted, LOG_WARN,
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+ LD_CIRC,"No unused circIDs found on channel %s wide "
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"circID support, with %u inbound and %u outbound circuits. "
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"Found %u circuit IDs in use by circuits, and %u with "
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"pending destroy cells."
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@@ -133,12 +138,14 @@ get_unique_circ_id_by_chan(channel_t *chan)
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chan->wide_circ_ids ? "with" : "without",
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chan->num_p_circuits, chan->num_n_circuits,
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n_with_circ, n_pending_destroy);
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- }
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return 0;
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}
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- crypto_rand((char*) &test_circ_id, sizeof(test_circ_id));
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- test_circ_id &= mask;
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+ do {
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+ crypto_rand((char*) &test_circ_id, sizeof(test_circ_id));
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+ test_circ_id &= mask;
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+ } while (test_circ_id == 0);
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+
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test_circ_id |= high_bit;
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in_use = circuit_id_in_use_on_channel(test_circ_id, chan);
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